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INSTITUTE FOR MATERIALS DISCOVERY

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Characterisation Materials and Thin Films


The IMD houses a wide range of specialist research equipmentÌýwith unique capabilities to resolve some of the most relevant scientific problems facing researchers today. The IMD characterisation facilities include:

  • Scanning Electron MicroscopyÌý[Zeiss EVO LS15, Oxford Instruments X-MaxN, Hitachi TMA4000Plus]
  • Semiconductor Device Analyzer [Keysight Technologies ltd]
  • X-ray FluorescenceÌý[Fischerscope X-RayÌýXan 250]
  • Nanoidentation [Micro MaterialsÌýNanoTest Vantage]Ìý
  • UV/Vis/NIRÌýSpectrophotometerÌý[PerkinElmer Lambda 750S]Ìý Ìý Ìý
  • FT-IR, NIR and FIR Spectrometer [PerkinElmer Spectrum Two]
  • Surface Profilometer [Bruker Dektak XT]Ìý
  • Optical Tensiometer [KRUSS, DSA10-Mk2]
  • Quartz Crystal Microbalance with Dissipation Monitoring [QSense Analyzer QCM-D]
  • X-ray Diffraction [Bruker D8 Advance; AERIS PANalytical Research Edition]
  • Raman Spectroscopy [RenishawÌýinViaâ„¢ confocal Raman Microscope; 532 and 611 wavelengths]
  • Gas Chromatographer/Mass Spectrometer [PerkinElmer Clarus SQ 8 S]
  • Thermogravimetric Analyzer [PerkinElmer TGA 4000]
  • Microwave Digestion System [Anton Paar Multiwave 5000]
  • Hall Effect Measurement System [Ecopia HMS-3000]
  • Four-point Probe System [OssilaÌýT2001A3]
  • BET Surface Area and Poer Analyzer [Nova Touch LX2]
  • Atomic Force Microscopy [NanosurfÌýCoreAFM with Isostage 300]
  • Thermoelectic InstrumentÌý[Linseis LSR-1]
  • Light ScatteringÌý[Malvern Panalytical Zetasizer Lab]
  • Plasma Surface Treatment [Diener electronic Zepto]
  • Optical Microscope [ZEISS SteREO Discovery.V12​]
  • Viscometer
  • Potentiostat/Galvanostat [PalmSens4, GamryÌýInterface 1010E,ÌýGamryÌýInterface 1010T, MetrohmÌýAutolab PGSTAT302N]
  • Battery Cyclers [BiologicÌýVMP-3e Multichannel Potentiostat, Neware BTS4000 series, Maccor 4300]
  • Solar Simulator [Newport CorporationÌýOriel® Sol1Aâ„¢
  • Electroluminescence Measurement System [Enli Technology ltd]Ìý Ìý Ìý Ìý Ìý Ìý Ìý Ìý Ìý Ìý Ìý Ìý Ìý Ìý Ìý Ìý Ìý Ìý Ìý Ìý Ìý Ìý
  • Quantum Efficiency Measurement System [Enlitech QE-R]
  • Differential Scanning Calorimentry [PerkinElmer DSC 4000]
  • Paios measurement platform (for solar cells/LEDs) [Fluxim AG]

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